The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
Test Heads, which are designed for a specific type of transient test, mate to a special Test Head Receiver on the mainframe. While Test Heads are designed to perform only one specific test, personality boards within each Test Head reconfigure the Test Head for a specific device, device package, and various device circuit arrangements.
网站首页
购物车
用户中心
全部产品分类
提示信息
免费咨询行业专家
